Details of the joint publications with Nanosil aknowledgment:
Publication
Workpackage
:
WP4 - Joint Modelling and Characterisation Platform
Type
:
Book or book chapter
Title
:
Substrate impact on threshold voltage and subthreshold slope of sub-32 nm ultra thin SOI MOSFETs with thin buried oxide and undoped channel, Solid-State Electronics
Title
:
Solid State Electronics, vol. 54, No. 2
Name(s) of participant(s) (conf) and Author(s) (papers)
:
S. Burignat, D. Flandre, M.K. Md Arshad, V. Kilchytska, F. Andrieu, O. Faynot and J.-P. Raskin