Calendar loading...
March 2010
S M T W T F S
 
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
     
 
Consortium area
SINANO INSTITUTE
Public Area

Scientific Publications

  • For the year 2009:

List of scientific publications and participations to conferences in the year 2009:
nanosil_publications_2009.pdf

  • For the year 2008:

- List of scientific publications and participations to conferences in the year 2008:

nanosil_publications_2008.pdf 


  • Details of the joint publications with Nanosil aknowledgment:


Search publications by key word

WP1 - More Moore

Date
Title
Author(s)
More info
No publication

WP2 - Beyond CMOS

Date
Title
Author(s)
More info
No publication

WP3 - Joint Processing Platform

Date
Title
Author(s)
More info
2008 Fabrication and characterisation of strained Si heterojunction bipolar transistors on virtual substrates S. Persson, M. Fjer, E. Escobedo-Cousin, G. Malm, Y.-B. Wang, P.-E. Hellstrom, M. Ostling, E. Parker, L.J. Nash, P. Majhi, S. Olsen, A. O'Neill More info

WP4 - Joint Modelling and Characterisation Platform

Date
Title
Author(s)
More info
2008 Reduced self-heating by strained silicon substrate engineering A. O'Neill, S. Olsen, Y. Yang, R. Agaiby, P.-E. Hellstrom, M. Ostling, K. Lyutivitch, E. Kasper, G. Enenman, P. Verheyen, R. Loo, C. Claeys, C. Fiegna, E. Sangiorgi More info
2008 Strained Si/SiGe MOS technology: improving gate dielectric integrity S. Olsen, L. Yan, R. Agaiby, E. Escobedo-Cousin, A. O'Neill, P.-E. Hellström, M. Ostling, K. Lyutovich, E. Kasper, C. Claeys, E. Parker More info
2008 A quasi two-dimensional compact drain current model for undoped symmetric double gate MOSFETs including short-channel effects F. Lime, B. Iniguez, O. Moldovan More info
2008 Experimental and Theoretical Analysis of Hole Transport in Uniaxially Strained pMOSFETs K. Huet, M. Feraille, D. Rideau, R. Delamare, V. Aubry-Fortuna, M. Kasbari, S. Blayac, C. Rivero, A. Bournel, C. Tavernier, P. Dollfus, H. Jaouen More info
2008 Carrier mobility in undoped triple-gate FinFET structures and limitations of its description in terms of top and sidewall channel mobilities T. Rudenko, V. Kilchytska, N. collaert, M. Jurczak, A. Nazarov, D. Flandre More info
2008 Extraction of n parameter characterizing mueff vs Eeff curves in strained Si nMOS devices K. Bennamane, M. De Michielis, G. Ghibaudo, D. esseni More info
2008 Monte Carlo study of apparent magnetoresistance mobility in nanometer scale metal oxyde semiconductor field effect transistors K. Huet, D. Querlioz, W. Chaisantikulwat, J. Saint-Martin, A. Bournel, M. Mouis, P. Dollfus More info

WP5 - Integration and Spread of Excellence

Date
Title
Author(s)
More info
No publication

WP6 - Consortium Management

Date
Title
Author(s)
More info
No publication